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市場調査レポート

顕微鏡市場

Microscopy Markets

発行 TriMark Publications 商品コード 133805
出版日 ページ情報 英文 238 Pages
納期: 即日から翌営業日
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本日の銀行送金レート: 1USD=101.50円で換算しております。
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顕微鏡市場 Microscopy Markets
出版日: 2013年10月01日 ページ情報: 英文 238 Pages
概要

従来の光学顕微鏡や電子顕微鏡は、新たに登場した原子間力顕微鏡(AFM)や共焦点ラマン顕微鏡などのシステムにより徐々に置き換えられていくという見方がありますが、実際には、複数の顕微鏡技術や分光法技術を組み合わせて1つの問題のさまざまな様相を総合的に調査することが可能な相関顕微鏡システムへと向かう大きなトレンドに寄与することで、今後も発展を続けると思われます。顕微鏡業界の企業は、計測技術の複雑化、顧客ベースを維持するのに必要な技術面のサポートなどさまざまな課題に直面していますが、顕微鏡技術は応用範囲が広いうえ、技術革新も進んでいるため、今後も成長を続けることができると思われます。

当レポートは、医療機関や研究機関で使用される各種顕微鏡の市場を詳細に分析したもので、米国市場と世界市場の現状、主要メーカーとその製品を紹介するとともに、半導体処理システムや自動画像処理システムなどの用途にも着目し、概略下記の構成でお届けします。

第1章 概要

第2章 顕微鏡技術:概要

  • 基本的な光学顕微鏡法
  • 電子顕微鏡法とその他の荷電粒子技術
    • 先進的な光学顕微鏡
      • 走査プローブ顕微鏡
      • フーリエ変換赤外顕微鏡
      • 紫外線顕微鏡
      • 超音波顕微鏡
      • X線顕微鏡/マイクロトモグラフィー(MCT、XMT、マイクロCT)

第3章 光学顕微鏡:概要

  • 光学顕微鏡の基本的なコンポーネント
    • レンズシステム
    • 解像度
    • 照明システム
  • 技術革新
    • 立体顕微鏡
  • 光学顕微鏡の主な用途
    • 半導体産業
    • 自動医用画像
  • 半導体および医療用途に対応する自動システムの成長促進要因
  • リアルタイム画像処理

第4章 蛍光顕微鏡:概要

  • 全反射蛍光顕微鏡
  • マルチフォトン顕微鏡
    • 基本原理
    • レーザー
    • マルチフォトン作業のための蛍光プローブ
    • アンケージング
    • 自己蛍光

第5章 レーザー走査共焦点顕微鏡

  • 基本原理
  • 光退色
  • 高性能蛍光共焦点画像処理システム
  • 主要ベンダーの光学、蛍光、マルチフォトンおよび共焦点顕微鏡
    • Becton Dickinson (BD)
    • KLA-Trencor
    • Korima, Inc.
    • Leica
    • ニコン
    • オリンパス
    • Veeco Instruments
    • Carl Zeiss
    • Visitron Systems GmbH

第6章 走査プローブ顕微鏡:概要

  • 近視野走査光学顕微鏡
    • 共振周波数
    • 絞り
    • 反射型
  • 近視野走査熱顕微鏡(NThM)
  • 原子間力顕微鏡
    • 半導体用途
    • 磁性体用途
    • 電気化学用途
    • 生命科学用途
  • 主要企業と製品
    • Agilent Technologies
    • Asylum Research
    • JEOL USA, Inc.
    • KLA-Tencor Corporation
    • Nanonics Imaging, Ltd.
    • Omicron NanoTechnology GmbH
    • Veeco Instruments, Inc.
    • WITec Instruments Corp.

第6章 赤外線顕微鏡と紫外線顕微鏡:概要

  • フーリエ変換赤外顕微鏡(FT-IR)
  • 紫外線顕微鏡
  • Bruker Optics
  • Craic Technologies
  • KLA-Tencor Corporation
  • Korima, Inc.
  • Thermo Scientific
  • 走査型超音波顕微鏡、X線マイクロトモグラフィーおよびラマン分光顕微鏡
    • 超音波顕微鏡(SAM)
    • X線マイクロトモグラフィー
    • ラマン分光顕微鏡
    • コヒーレントアンチストークスラマン散乱顕微鏡
    • 超音波顕微鏡の主要企業と製品
    • Sonix, Inc.
    • Sonoscan, Inc.
    • X線マイクロトモグラフィーの主要企業と製品
    • Cameca Instruments, Inc.
    • SkyScan
    • Bruker Optics
    • ラマン顕微鏡の主要企業と製品
    • Horiba Jobin Yvon
    • Renishaw

第8章 電子顕微鏡:概要

  • 透過型電子顕微鏡(TEM)
    • 電子源
  • 走査電子顕微鏡(SEM)
    • ラスタリング
    • 試料調査
    • 画像タイプ
    • 環境制御型SEMと低真空SEM
    • 低電圧SEM
    • テーブルトップモデル
  • 用途
  • 走査/透過型電子顕微鏡
  • 電子プローブマイクロアナライザー(マイクロプローブ)
  • オージェ電子顕微鏡/分光法
  • 電子ビーム(Eビーム)リソグラフィー
  • 集束イオンビーム顕微鏡とデュアルビーム顕微鏡
  • 二次イオン質量分析法(SIMS)
  • 化学分析のためのX線光電子分光法/電子分光法
  • 走査ヘリウムイオンビーム顕微鏡
  • 補助分析装置
  • 主要企業・製品

第9章 Microscopy Today Innovation Awards

第10章 顕微鏡市場:イントロダクション

  • 競合
  • 成長阻害因子
  • 成長促進因子
  • 購入者の展望
  • 顕微鏡市場
  • 市場リーダー4社
  • 世界の顕微鏡・付属品市場
  • 顕微鏡市場のシェア:用途別
    • 半導体産業
    • ライフサイエンス
    • 材料科学
    • ナノテクノロジー産業
  • 世界の光学顕微鏡市場
    • 米国
    • 欧州
    • その他
    • 電子顕微鏡市場

第11章 主要企業

  • Applied Materials, Inc.
  • Becton, Dickinson and Company
  • Bruker Optics
  • Buehler
  • Carl Zeiss, Inc.
  • FEI Company
  • Gatan
  • Hitachi High-Technologies America, Inc.
  • JEOL
  • KLA-Tencor Corporation
  • Leica Microsystems (part of Danaher Corporation)
  • Nanonics Imaging, Ltd.
  • ニコン
  • オリンパス
  • Omicron Nanotechnology
  • WITec (Wissenschaftliche Instrumente und Technologie) GmbH
  • Zao NT-MDT Company

図表

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目次
Product Code: TMRMICRO13-1001

Microscopy is a complex, high-technology market focused on producing enlarged images of very small objects. There is a perception that traditional light and electron microscopy will gradually be replaced by the newly emerging Atomic Force Microscopy (AFM) and Raman confocal systems, but traditional techniques will in reality continue to thrive as they contribute to a growing trend toward correlative microscopy in which multiple microscopy and/or spectroscopy techniques combine to investigate several integrated facets of a problem. Microscopy industry players face numerous challenges, including the complexity of the instrumentation and the technical support required to maintain customer bases, but the broad applicability of microscopy techniques and ongoing innovations continue to drive growth in the sector. This TriMark Publications report describes major microscope market segments and includes examinations of light, confocal, electron, ion and scanning probe microscopes. It assesses the microscopy market drivers and bottlenecks from the perspective of the medical and scientific communities and discusses the potential benefits of the microscopy market for different sectors. The focus is on end-user markets, including hospitals, research facilities, freestanding clinics and equipment-leasing companies. This study also examines companies that are actively developing and marketing microscopy products around the world. The report includes current and forecasted market shares by company and profit/business opportunities by imaging segment.

Table of Contents

1. Overview

  • 1.1. Statement of Report
  • 1.2. Scope of This Report
  • 1.3. Objectives
  • 1.4. Methodology
  • 1.5. Aims of This Report
  • 1.6. Executive Summary

2. Microscopy Technologies: An Overview

  • 2.1. Basic Optical Microscopy
  • 2.2. Electron Microscopy and Other Charged Particles Technologies
    • 2.2.1. Advanced Optical Microscopy
      • 2.2.1.1. Scanning Probe Microscopy
      • 2.2.1.2. Fourier Transform Infrared Microscopy
      • 2.2.1.3. Ultraviolet Microscopy
      • 2.2.1.4. Scanning Acoustic Microscopy
      • 2.2.1.5. X-Ray Microscopy/Microtomography (MCT, XMT, Micro-CT)

3. Optical Microscopy: An Overview

  • 3.1. Basic Components of an Optical Microscope
    • 3.1.1. Lens Systems
    • 3.1.2. Resolution
    • 3.1.3. Illumination Systems
  • 3.2. Innovations
    • 3.2.1. Stereo Microscope
  • 3.3. Major Applications of Optical Microscopy
    • 3.3.1. Applications in Semiconductor Industry
    • 3.3.2. Automated Medical Imaging
  • 3.4. Market Drivers for Automated Systems for Semiconductor and Medical Applications
  • 3.5. Real-Time Imaging

4. Fluorescence Microscopy: An Overview

  • 4.1. Total Internal Reflection Fluorescence Microscopy
  • 4.2. Multi-Photon Microscopy
    • 4.2.1. Basic Principles
    • 4.2.2. Lasers
    • 4.2.3. Fluorophores for Multi-Photon Work
    • 4.2.4. Uncaging
    • 4.2.5. Antifluorescence

5. Laser Scanning Confocal Microscopy

  • 5.1. Basic Principles
  • 5.2. Photobleaching
  • 5.3. High-Throughput Fluorescence and Confocal Imaging Systems
  • 5.4. Optical, Fluorescence, Multi-Photon and Confocal Microscopes from Major Vendors
    • 5.4.1. Clinical and Cell Kinetics Microscope from Becton Dickinson (BD)
    • 5.4.2. Optical Metrology Microscopes for Semiconductor Industry from KLA-Trencor
    • 5.4.3. Korima, Inc.ís Protein Review Station
    • 5.4.4. Leica Microsystemsí Products
      • 5.4.4.1. Upright Clinical and Fluorescence Microscopes
      • 5.4.4.2. Leicaís Inverted Clinical and Fluorescence Microscopes
      • 5.4.4.3. Leicaís Optical Microscopes for Education
      • 5.4.4.4. Stereo- and Modular Microscopes for Quality Control, Routine Inspection, Education and Research from Leica
      • 5.4.4.5. Automated Research Microscopes from Leica
      • 5.4.4.6. High-Precision Fluorescence Microscopes from Leica
      • 5.4.4.7. Confocal Microscopes (Including Fluorescence and Multi-Photon Capability) from Leica
      • 5.4.4.8. Surgical Operating Microscopes from Leica
    • 5.4.5. Nikonís Products
      • 5.4.5.1. Nikonís Upright Microscopes Specialized for Life Sciences Research
      • 5.4.5.2. Nikonís Upright Models Specialized for Industrial Applications
      • 5.4.5.3. Nikonís Inverted Microscopes Specialized for Life Sciences Research
      • 5.4.5.4. Inverted Microscopes Specialized for Industrial Applications from Nikon
      • 5.4.5.5. Nikonís Stereomicroscopes
      • 5.4.5.6. Nikonís Educational Microscopes
      • 5.4.5.7. Nikonís Clinical and Research Microscopes
      • 5.4.5.8. Nikonís Polarizing Microscopes
      • 5.4.5.9. Nikonís Confocal Microscopes
      • 5.4.5.10. Nikonís Measuring Microscopes (Including Confocal Capability) and Industrial Microscopes
    • 5.4.6. Olympusí Products
      • 5.4.6.1. Olympusí Stereomicroscopes
      • 5.4.6.2. Polarizing Microscopes from Olympus
      • 5.4.6.3. Inverted Microscopes from Olympus
      • 5.4.6.4. Olympusí Fluorescence Microscope for Biology
      • 5.4.6.5. Confocal Microscopes for Biology from Olympus
    • 5.4.7. Products from Veeco Instruments
      • 5.4.7.1. White Light Interferometry (Optical Profiler) Microscopes from Veeco
    • 5.4.8. Products from Carl Zeiss
      • 5.4.8.1. Stereomicroscopes (Including Fluorescence Capability) from Carl Zeiss
      • 5.4.8.2. Upright Microscopes from Carl Zeiss
      • 5.4.8.3. Inverted Microscopes from Carl Zeiss
      • 5.4.8.4. Polarizing Microscopes from Carl Zeiss
      • 5.4.8.5. Confocal Microscopes (Including Fluorescence and Multi-Photon Capabilities) from Carl Zeiss
    • 5.4.9. Products from Visitron Systems GmbH
      • 5.4.9.1. Modular Confocal Scanners from Visitron

6. Scanning Probe Microscopy: An Overview

  • 6.1. Near-Field Scanning Optical Microscopy
    • 6.1.1. Resonance Frequency
    • 6.1.2. Aperture
    • 6.1.3. Reflection Mode
  • 6.2. Near-Field Scanning Thermal Microscopy
  • 6.3. Atomic Force Microscopy
    • 6.3.1. Semiconductor Applications
    • 6.3.2. Magnetic Material Applications
    • 6.3.3. Electrochemical Applications
    • 6.3.4. Life Sciences Applications
  • 6.4. Major Players and Products of AFM
    • 6.4.1. Atomic Force Microscopes from Agilent Technologies
    • 6.4.2. Atomic Force Microscopes from Asylum Research
    • 6.4.3. Scanning Probe Microscopes from JEOL USA, Inc.
    • 6.4.4. Atomic Force Metrology Tool for the Semiconductor Industry from KLA-Tencor
    • 6.4.5. Scanning Probe Microscopes from Nanonics Imaging Ltd.
    • 6.4.6. Surface Science Systems from Omicron NanoTechnology GmbH
    • 6.4.7. Scanning Probe and AFM for Industry and the Life Sciences from Veeco
    • 6.4.8. Automated AFM/AFP Systems for Metrology and Instrumentation
    • 6.4.9. Combination Scanning Probe Microscopes from WITec Instruments Corp.

7. Infrared and Ultraviolet Microscopy: An Overview

  • 7.1. Fourier-Transfer Infrared Microscopy (FT-IR)
  • 7.2. Ultraviolet Microscopy
  • 7.3. Infrared Microscopes for the Life Sciences from Bruker Optics
  • 7.4. Multidisciplinary UV-Visible-NIR Microscopes and Modules from Craic Technologies
  • 7.5. UV Metrology Tools for the Semiconductor Industry from KLA-Tencor Corporation
  • 7.6. UV-Visible-NIR Microscopes for the Semiconductor Industry from Korima, Inc.
  • 7.7. Infrared Microscopes from Thermo Scientific
  • 7.8. Scanning Acoustic Microscopy, X-Ray Microtomography and Raman Spectroscopy
    • 7.8.1. Scanning Acoustic Microscopy (SAM)
    • 7.8.2. X-Ray Microtomography
    • 7.8.3. Raman Spectroscopy Microscopy
    • 7.8.4. Coherent Anti-Stokes Raman Scattering Microscopy
    • 7.8.5. Scanning Acoustic Microscopes for Industrial Applications from Sonix, Inc.
    • 7.8.6. Scanning Acoustic Systems for Industrial Applications from Sonoscan, Inc.
    • 7.8.7. Tomographic Atom Probe for Semiconductors and Materials from Cameca
    • 7.8.8. Microtomography for Industry, Research and the Life Sciences from SkyScan
    • 7.8.9. Raman Microscopy from Bruker Optics
    • 7.8.10. Raman Analytical Microscopes from Horiba Jobin Yvon
    • 7.8.11. Raman Microscope from Renishaw
    • 7.8.12. Raman Hybrid Microscopes from Renishaw

8. Electron Microscopes: An Overview

  • 8.1. Transmission Electron Microscope (TEM)
    • 8.1.1. Electron Source
  • 8.2. Scanning Electron Microscope (SEM)
    • 8.2.1. Rastering
    • 8.2.2. Exploring the Sample
    • 8.2.3. Types of Images
    • 8.2.4. Environmental SEM and Variable Pressure SEM (VPSEM)
    • 8.2.5. Low-Voltage Scanning Electron Microscopy
    • 8.2.6. Tabletop Models
  • 8.3. Applications
  • 8.4. Scanning/Transmission Electron Microscope
  • 8.5. Electron Probe Microanalyzer (Microprobe)
  • 8.6. Auger Electron Microscopy/Spectroscopy (Auger)
  • 8.7. Electron Beam (E-Beam) Lithography
  • 8.8. Focused Ion Beam and Dual-Beam Microscope
  • 8.9. Secondary Ion Mass Spectrometry (SIMS)
  • 8.10. X-Ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis
  • 8.11. Scanning Helium Ion Beam Microscopy
  • 8.12. Ancillary Analytical Attachments
    • 8.12.1. Energy-Dispersive and Wavelength-Dispersive X-Ray Microanalyzers
    • 8.12.2. Electron Backscatter Diffraction
    • 8.12.3. Cathodoluminescence (CL)
    • 8.12.4. X-Ray Microtomography
    • 8.12.5. Raman Spectroscopy
  • 8.13. Major Players and Products
    • 8.13.1. Electron Probe Microanalyzer for Research from Cameca Instruments, Inc.
    • 8.13.2. Secondary Ion Mass Spectrometry (SIMS) for Materials and Semiconductors from Cameca
    • 8.13.3. Magnetic Sector Secondary Ion Mass Spectrometry (SIMS) for Semiconductor Technology
    • 8.13.4. SIMS Microprobe for Materials, Semiconductors, Geology, Space Science and Biology
    • 8.13.5. Metrology SIMS for Semiconductors and Materials from Cameca
    • 8.13.6. Metrology ULE SIMS for Semiconductors
    • 8.13.7. TEM and SEM from FEI Company
    • 8.13.8. SEM for Education, the Life Sciences, Materials Sciences, Semiconductor and Data Storage Industries from FEI
    • 8.13.9. Focused Ion Beam Microscopes for Materials Science and Industry from FEI
    • 8.13.10. FIB/SEM Dual-Beam Systems for Electron Imaging with Ion and Electron Milling from FEI
    • 8.13.11. TEM and STEM for Industry, Materials Sciences and Life Sciences from Hitachi
    • 8.13.12. Scanning Electron Microscopes for Education, Industry, the Materials Sciences and Life Sciences from Hitachi
    • 8.13.13. Focused Ion Beam Microscopes from Hitachi
    • 8.13.14. Dual Beam System from Hitachi
    • 8.13.15. Metrology SEM from Hitachi
    • 8.13.16. Defect-Review SEM from Hitachi
    • 8.13.17. Transmission Electron Microscopes (Including STEM) from JEOL USA
    • 8.13.18. Scanning Electron Microscopes from JEOL
    • 8.13.19. Focused Ion Beam Microscope from JEOL
    • 8.13.20. Dual-Beam Microscopes from JEOL
    • 8.13.21. Traditional, ESCA and Auger Microprobes from JEOL
    • 8.13.22. Electron Beam Lithography Systems from JEOL
    • 8.13.23. Wafer Inspection Scanning Electron Microscopes from JEOL
    • 8.13.24. Electron-Beam Metrology Tools for the Semiconductor Industry from KLA-Tencor
    • 8.13.25. Auger-Capable Scanning Electron Microscope from Omicron Nanotechnology GmbH
    • 8.13.26. Electron Spectroscopy for Chemical Analysis/X-Ray Photoelectron Spectroscopy (ESCA/XPS) and Auger from Omicron
    • 8.13.27. Independent Scanning Probe/SEM/STM/Auger Analytical Measurement System for Industry from Omicron
    • 8.13.28. In Situ SPM/SEM/SAM/FIB Systems from Omicron
    • 8.13.29. Focused Ion/SEM Dual-Beam System from Omicron
    • 8.13.30. Electron-Beam Lithography Systems from Vistec Lithography
    • 8.13.31. Transmission Electron Microscopes (Including STEM) from Carl Zeiss
    • 8.13.32. Scanning Electron Microscopes from Carl Zeiss
    • 8.13.33. FIB/SEM Dual-Beam Systems from Carl Zeiss
    • 8.13.34. Helium-Ion Microscope from Carl Zeiss

9. 2012 Microscopy Today Innovation Awards

  • 9.1. Dimension FastScan AFM
  • 9.2. Vion Plasma Focused Ion Beam
  • 9.3. K2 Summit Direct Detection Camera
  • 9.4. Leica SR GSD Super-Resolution Microscope System
  • 9.5. Internal Pulse Generator for the X-Cite XLED1
  • 9.6. SCALEVIEW Microscope Objectives
  • 9.7. Multimodal Electrochemical Probe for In Situ TEM
  • 9.8. ARROW Hyperspectral Imaging Video Camera R
  • 9.9. 3D-OMiTEM
  • 9.10. Tousimis Touch Screen 931 with ìStasis Softwareî

10. Microscopy Markets: An Introduction

  • 10.1. Competition in Microscopy Markets
  • 10.2. Barriers to Growth
  • 10.3. Market Drivers
  • 10.4. Purchasersí Perspectives
  • 10.5. The Microscope Market Place
  • 10.6. The Four Market Leaders
  • 10.7. Global Market for Microscopes and Accessories
    • 10.7.1. Global Market for Microscopes Excluding Accessories
    • 10.7.2. Market for Accessories of Microscopes
  • 10.8. Microscopy Market Share by Application
    • 10.8.1. Market for Microscopes in Semiconductor Industry
    • 10.8.2. Market for Microscopes in Life Sciences
    • 10.8.3. Market for Microscopes in Material Sciences Industry
    • 10.8.4. Microscopy Market in Nanotechnology Industry
  • 10.9. Global Market for Optical Microscopes
    • 10.9.1. U.S. Market for Light Microscopes
    • 10.9.2. European Market for Optical Microscopes
    • 10.9.3. Rest of the World Markets for Optical Microscopes
    • 10.10. Market for Electron Microscopes

11. Selected Company Profiles

  • 11.1. Applied Precision, Inc.
    • 11.1.1. DeltaVision OMX
    • 11.1.2. DeltaVision OMX with the Blaze SIM Module
    • 11.1.3. DV Elite
    • 11.1.4. PersonalDV
    • 11.1.5. softWoRx Explorer 2.0
    • 11.1.6. softWoRx Suite 2.0
  • 11.2. Becton, Dickinson and Company
    • 11.2.1. BD Pathway 855
  • 11.3. Bruker Corporation
    • 11.3.1. MultiMode 8
    • 11.3.2. BioScope Catalyst
    • 11.3.3. Dimension FastScan Bio
    • 11.3.4. Innova Atomic Force Microscope
    • 11.3.5. InSight-450 3DAFM
    • 11.3.6. InSight 3DAFM
    • 11.3.7. Dimension Icon
    • 11.3.8. Dimension Edge
    • 11.3.9. ContourGT-1
    • 11.3.10. ContourGT InMotion
    • 11.3.11. ContourGT K
    • 11.3.12. ContourGT X
  • 11.4. Buehler Ltd.
    • 11.4.1. AbrasiMet 250 Abrasive Cutter
    • 11.4.2. AbrasiMatic 300 Abrasive Cutter
    • 11.4.3. Delta Manual Abrasive Cutter
    • 11.4.4. Delta Orbital and Chop Action Cutter
    • 11.4.5. IsoMet 1000 Precision Saw
    • 11.4.6. IsoMet 4000 and 5000 Precision Saws
    • 11.4.7. IsoMet Low Speed Saw
  • 11.5. Carl Zeiss Microscopy, LLC
    • 11.5.1. Light Microscopes
      • 11.5.1.1. Axio Imager 2 for Biology
      • 11.5.1.2. Axio Imager 2 for Materials
      • 11.5.1.3. Axio Imager for Polarized Light Microscopy
      • 11.5.1.4. Axio Imager Vario
      • 11.5.1.5. Axio Observer for Biology
      • 11.5.1.6. Axio Observer for Materials
      • 11.5.1.7. Axio Examiner for Biology
      • 11.5.1.8. Axio Scope A1 for Biology
      • 11.5.1.9. Axio Scope A1 for Materials
      • 11.5.1.10. Axio Vert A1 for Biology
      • 11.5.1.11. Axio Lab A1 for Biology
      • 11.5.1.12. Primo Vert
      • 11.5.1.13. Primo Star
    • 11.5.2. Laser Scanning Microscopes
      • 11.5.2.1. LSM 710 ConfoCor 3
      • 11.5.2.2. LSM 710 NLO and LSM 780 NLO
      • 11.5.2.3. LSM 710
      • 11.5.2.4. LSM 780
      • 11.5.2.5. LSM 7 MP
      • 11.5.2.6. LSM 700 Biology
    • 11.5.3. X-Ray Microscopy
      • 11.5.3.1. ZEISS Xradia 410 Versa
      • 11.5.3.2. ZEISS Xradia 520 Versa
      • 11.5.3.3. ZEISS Xradia 800 Ultra
    • 11.5.4. Stereo and Zoom Microscopes
      • 11.5.4.1. Axio Zoom V16
      • 11.5.4.2. SteREO Discovery V20
      • 11.5.4.3. SteREO Discovery V12
      • 11.5.4.4. SteREO Discovery V8
      • 11.5.4.5. Stemi 2000
      • 11.5.4.6. Stemi DV4
      • 11.5.4.7. SteREO Lumar V12
    • 11.5.5. Superresolution Microscopy
      • 11.5.5.1. ELYRA
    • 11.5.6. Correlative Microscopy
      • 11.5.6.1. Shuttle & Find
    • 11.5.7. Scanning Electron Microscopes
      • 11.5.7.1. EVO for MA
      • 11.5.7.2. EVO LS
      • 11.5.7.3. EVO HD for Materials
      • 11.5.7.4. EVO HD LS
      • 11.5.7.5. SIGMA
      • 11.5.7.6. MERLIN
  • 11.6. FEI Company
    • 11.6.1. Scanning Electron Microscopes (SEM)
      • 11.6.1.1. Magellan XHR
      • 11.6.1.2. Verios
      • 11.6.1.3. Nova NanoSEM
      • 11.6.1.4. Quanta SEM
      • 11.6.1.5. Inspect SEM
    • 11.6.2. Transmission Electron Microscopes (TEM)
      • 11.6.2.1. Titan S/TEM
      • 11.6.2.2. Tecnai TEM
    • 11.6.3. DualBeam Systems
      • 11.6.3.1. Scios DualBeam
      • 11.6.3.2. Helios NanoLab 660
    • 11.6.4. Focused Ion Beam (FIB) Systems
      • 11.6.4.1. V600 FIB
      • 11.6.4.2. V600 CE
    • 11.6.5. Light Microscopy
      • 11.6.5.1. Intravital 2 Photon
      • 11.6.5.2. FEI iMIC
  • 11.7. Gatan, Inc.
    • 11.7.1. Specimen Preparation Tools
      • 11.7.1.1. Ilion II
      • 11.7.1.2. Model 681 PIPS High Resolution Ion Beam Coater
      • 11.7.1.3. Model 682 PECS
      • 11.7.1.4. 683 Met-Etch
      • 11.7.1.5. PIPS II
  • 11.8. Hitachi High-Technologies America, Inc.
    • 11.8.1. TM3000
    • 11.8.2. H-9500 300 kV TEM
    • 11.8.3. HD-2700 Cs-Corrected FE-STEM
    • 11.8.4. HF-3300 300 kV FE-TEM
    • 11.8.5. HT7700 120 kV Compact-Digital Biological TEM
    • 11.8.6. HT7710 120 kV BF/DF STEM
  • 11.9. JEOL Ltd.
    • 11.9.1. Transmission Electron Microscopes (TEM)
      • 11.9.1.1. JEM-1000
      • 11.9.1.2. JEM-3100F
      • 11.9.1.3. JEM-3200FS
      • 11.9.1.4. JEM-ARM200F
      • 11.9.1.5. JEM-2200FS
      • 11.9.1.6. JEM-2100F
      • 11.9.1.7. JEM-2100
      • 11.9.1.8. JEM-2800
      • 11.9.1.9. JEM-1400Plus
      • 11.9.1.10. JED-2300T
    • 11.9.2. Scanning Electron Microscopes
      • 11.9.2.1. JSM-7800F
      • 11.9.2.2. JSM-7610F
      • 11.9.2.3. JSM-7500F
      • 11.9.2.4. JSM-7100F
      • 11.9.2.5. JSM-6610
      • 11.9.2.6. JSM-6510
      • 11.9.2.7. JASM-6200
      • 11.9.2.8. JSM-6010LA
      • 11.9.2.9. JCM-6000
  • 11.10. KLA-Tencor Corporation
    • 11.10.1. Broadband Patterned Wafer Defect Inspection Systems
    • 11.10.2. Narrowband Patterned Wafer Defect Inspectors
    • 11.10.3. Electron Beam Wafer Inspection Systems
    • 11.10.4. High-Sampling Patterned-Wafer Defect Inspection System
    • 11.10.5. Macro Defect Inspection, Metrology and Review Cluster Tool
    • 11.10.6. Wafer Edge Inspection and Metrology Systems
    • 11.10.7. Macro Defect Inspection Systems for Patterned Wafers
    • 11.10.8. Unpatterned Wafer Surface Inspection Systems
    • 11.10.9. Reticle Defect Inspection Systems for IC Fab Applications
    • 11.10.10. ICOS CI-T620 Component Inspector
    • 11.10.11. ICOS CI-T120/CI-T130
    • 11.10.12. ICOS CI-T120S/CI-T130S
    • 11.10.13. ICOS CI-3050
    • 11.10.14. ICOS WI-2xx0
    • 11.10.15. ICOS WI-22xx Series
    • 11.10.16. ICOS WI-2280 Series
    • 11.10.17. e-Beam Wafer Defect Review and Classification System
    • 11.10.18. Archer Series
    • 11.10.19. SpectraShape Family
    • 11.10.20. Aleris Family
    • 11.10.21. SpectraFx 200
    • 11.10.22. Surfscan Series
    • 11.10.23. Therma-Probe Series
    • 11.10.24. HRP-350
    • 11.10.25. IPRO Series
    • 11.10.26. CIRCL
    • 11.10.27. VisEdge Family
  • 11.11. Leica Microsystems
    • 11.11.1. Leica TCS SP8 STED
    • 11.11.2. Leica TCS SP8X
    • 11.11.3. Leica TCS SP8 MP
    • 11.11.4. Leica TCS SP8 CARS
    • 11.11.5. Leica TCS SP8 SMD
    • 11.11.6. Leica HCS A
    • 11.11.7. Leica TCS SPE
    • 11.11.8. Leica TCS LSI
    • 11.11.9. Leica SD AF
    • 11.11.10. Leica DCM 3D
    • 11.11.11. Leica SR GSD
    • 11.11.12. Leica DM2700 M
    • 11.11.13. Leica DM2700 P
    • 11.11.14. Leica DMshare
    • 11.11.15. Leica DM1000
    • 11.11.16. Leica DM1750 M
    • 11.11.17. Leica DM4000 B LED
    • 11.11.18. Leica DMD108
    • 11.11.19. Leica DM IL LED
    • 11.11.20. Leica DM1000 LED
    • 11.11.21. Leica DM4000 M LED
    • 11.11.22. Leica DM4500 P LED
    • 11.11.23. Leica FS4000 LED
    • 11.11.24. Leica DM2500
    • 11.11.25. Leica DM2000 and DM2000 LED
    • 11.11.26. Leica DMI4000 B
    • 11.11.27. Leica DM8000 M
    • 11.11.28. Leica DM12000 M
    • 11.11.29. Leica SD AF
    • 11.11.30. Leica MMAF
    • 11.11.31. Leica DM16000 B
    • 11.11.32. Leica DM6000 B
    • 11.11.33. Leica MM AF NX
    • 11.11.34. Leica Multiviews
    • 11.11.35. Leica SFL7000
    • 11.11.36. Leitz Optilux
    • 11.11.37. Leica DM100
    • 11.11.38. Leica DM300
    • 11.11.39. Leica DM500
    • 11.11.40. Leica DM750
    • 11.11.41. Leica DCM 3D
    • 11.11.42. Leica DM6000 M
    • 11.11.43. Leica DM2500 MH
    • 11.11.44. Leica DM2500 M
    • 11.11.45. Leica DM750 M
    • 11.11.46. Leica DM15000 M
    • 11.11.47. Leica DM13000 M
    • 11.11.48. Leica DM ILM
    • 11.11.49. Leica DM750 P
    • 11.11.50. Leica AF6000 Modular Systems
    • 11.11.51. Leica AM6000
    • 11.11.52. Leica DM13000 B
    • 11.11.53. Leica DM5500 B
    • 11.11.54. Leica-DM5000 B
    • 11.11.55. Leica DM3000 and DM3000 LED
    • 11.11.56. Leica FS CB
    • 11.11.57. Leica FS C
    • 11.11.58. Leica FS M
    • 11.11.59. Leica M844 F40/F20
    • 11.11.60. Leica M822 F40/F20
    • 11.11.61. Leica M820 F40/F20
    • 11.11.62. Leica M720 OH5
    • 11.11.63. Leica M620 F20
    • 11.11.64. Leica M525 F50
    • 11.11.65. Leica M525 OH4
    • 11.11.66. Leica M525 MS3
    • 11.11.67. Leica M525 F40
    • 11.11.68. Leica M651 MSD
    • 11.11.69. Leica M525 F20
    • 11.11.70. Leica M320 F12
    • 11.11.71. Leica M220 F12
    • 11.11.72. Leica M400 E
    • 11.11.73. Leica ES2
    • 11.11.74. Leica EZ4
    • 11.11.75. Leica EZ4 HD
    • 11.11.76. Leica S4 E
    • 11.11.77. Leica S6 E
    • 11.11.78. Leica DMS300
    • 11.11.79. Leica DMS1000
    • 11.11.80. Leica DMS1000 B
    • 11.11.81. Leica DVM5000 HD
    • 11.11.82. Leica DVM2500
  • 11.12. Nanonics Imaging Ltd.
    • 11.12.1. NSOPM and SPM Systems
      • 11.12.1.1. Academia
      • 11.12.1.2. MultiView 1000
      • 11.12.1.3. MultiView 4000
      • 11.12.1.4. Hydra Bio-SPM
      • 11.12.1.5. Fountain Pen Nanolithography
      • 11.12.1.6. Combined AFM FIB and AFM SEM
      • 11.12.1.7. MultiView 2000
      • 11.12.1.8. Optometronic 4000
      • 11.12.1.9. CryoView 2000
      • 11.12.1.10. CryoView 4000 SPM
    • 11.12.2. Dual Optical Microscopes
      • 11.12.2.1. Nanonics Confocal Microscope
      • 11.12.2.2. Dual (Upright/Inverted) Microscope
  • 11.13. Nikon Corporation
    • 11.13.1. ECLIPSE Ni-E
    • 11.13.2. ECLIPSE Ci-E
    • 11.13.3. ECLIPSE E100
    • 11.13.4. ECLIPSE FN1
    • 11.13.5. ECLIPSE E200
    • 11.13.6. ECLIPSE LV100N POL
    • 11.13.7. ECLIPSE Ci-POL
    • 11.13.8. ECLIPSE E200POL
    • 11.13.9. ECLIPSE Ti
    • 11.13.10. ECLIPSE TS100/100-F
    • 11.13.11. NT-88-V3
    • 11.13.12. Laser TIRF System
    • 11.13.13. White-Light TIRF System
    • 11.13.14. SMZ25/SMZ18
    • 11.13.15. SMZ1000
    • 11.13.16. SMZ800
    • 11.13.17. SMZ745/745T
    • 11.13.18. SMZ660
    • 11.13.19. MULTIZOOM AZ100
    • 11.13.20. MULTIZOOM AZ100M
    • 11.13.21. ECLIPSE LV100ND POL/DS
    • 11.13.22. ShuttlePix
    • 11.13.23. N-SIM
    • 11.13.24. N-STORM
    • 11.13.25. A1+/A1R+
    • 11.13.26. C2+
    • 11.13.27. A1 MP+/A1R MP+
    • 11.13.28. AZ-C2+
  • 11.14. Olympus Corporation
    • 11.14.1. Biological Confocal Laser Scanning Microscope FV 1200
    • 11.14.2. FV1200MPE (Multiphoton Laser Scanning Microscope)
    • 11.14.3. FLUOVIEW FV10i
    • 11.14.4. BX63
    • 11.14.5. BX53
    • 11.14.6. BX46
    • 11.14.7. BX43
    • 11.14.8. CX41
    • 11.14.9. CX31
    • 11.14.10. CX22LED and CX22
    • 11.14.11. BX51WI
    • 11.14.12. BX53-P
    • 11.14.13. CX31-P
    • 11.14.14. FSX100
    • 11.14.15. MVX10
    • 11.14.16. CellSens
    • 11.14.17. Total Internal Reflection Fluorescence Microscope (TIRFM)
    • 11.14.18. IX83
    • 11.14.19. IX73
    • 11.14.20. IX53
    • 11.14.21. CKX31 and CKX41
    • 11.14.22. ON3
    • 11.14.23. SZX16
    • 11.14.24. SZX10
    • 11.14.25. SZX7
    • 11.14.26. SZ61
    • 11.14.27. SZ51
  • 11.15. Omicron NanoTechnology GmbH
    • 11.15.1. Low Temperature SPM
      • 11.15.1.1. LT STM
      • 11.15.1.2. Cryogenic STM and SFM
    • 11.15.2. Variable Temperature SPM
      • 11.15.2.1. VT SPM
      • 11.15.2.2. Femi SPM
    • 11.15.3. Room Temperature SPM
      • 11.15.3.1. UHV AFM/STM
      • 11.15.3.2. UHV STM 1
    • 11.15.4. Large Sample SPM
    • 11.15.5 4. Probe SPM
      • 11.15.5.1. UHV Nanoprobe
      • 11.15.5.2. LT Nanoprobe
    • 11.15.6. SPM Probe
  • 11.16. WITec Wissenschaftliche Instrumente und Technologie GmbH
    • 11.16.1. Alpha300 S
    • 11.16.2. Alpha300 R
    • 11.16.3. Alpha300A
  • 11.17. Zao NT-MDT Company
    • 11.17.1. NTEGRA Spectra
    • 11.17.2. NTEGRA Spectrum
    • 11.17.3. Bio AFM
    • 11.17.4. NTEGRA Prima
    • 11.17.5. NTEGRA Aura
    • 11.17.6. NEXT
    • 11.17.7. OPEN
    • 11.17.8. SOLVER Nano

INDEX OF FIGURES

  • Figure 3.1: Basic Components of an Optical Microscope
  • Figure 3.2: Stereo Microscope
  • Figure 10.1: Microscopy Market Share by Leading Vendors
  • Figure 10.2: Global Market for Microscopes and Accessories, 2012-2019
  • Figure 10.3: Global Market for Microscopes Excluding Accessories, 2012-2019
  • Figure 10.4: Global Market for Accessories of Microscopes, 2012-2019
  • Figure 10.5: Microscopy Market Share by Application
  • Figure 10.6: Market for Microscopes in Semiconductor Industry, 2012-2019
  • Figure 10.7: Market for Microscopes in Life Sciences, 2012-2019
  • Figure 10.8: Market for Microscopes in Material Sciences Industry, 2012-2019
  • Figure 10.9: Market for Microscopes in Nanotechnology Industry, 2012-2019
  • Figure 10.10: Global Market for Optical Microscopes, 2012-2019
  • Figure 10.11: U.S. Market for Optical Microscopes, 2012-2019
  • Figure 10.12: European Market for Optical Microscopes, 2012-2019
  • Figure 10.13: Rest of the World Markets for Optical Microscopes, 2012-2019
  • Figure 10.14: Global Electron Microscope Market, 2012-2019

INDEX OF TABLES

  • Table 3.1: Basic Components of an Optical Microscope
  • Table 6.1: Types of Scanning Probe Microscopes
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