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市場調査レポート

世界における薄膜計測システム市場

Global Thin Film Metrology Systems Market 2015-2019

発行 TechNavio (Infiniti Research Ltd.) 商品コード 294978
出版日 ページ情報 英文 63 Pages
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世界における薄膜計測システム市場 Global Thin Film Metrology Systems Market 2015-2019
出版日: 2015年01月28日 ページ情報: 英文 63 Pages
概要

2014年の世界における薄膜計測システム市場の収益は、その多くがアジア太平洋地域からもたらされました。これは、韓国、台湾、中国、日本のフラットパネルTV、PC,モバイル端末、タブレットのODMおよびOEMからの需要の増加によるものです。世界の薄膜計測システム市場は、2014年から2019年にかけて、3.4%の複合年間成長率(CAGR)で拡大する見込みです。

当レポートでは、世界の薄膜計測システム市場の現状と将来の見通し、成長要因と課題、主要ベンダーの分析などを提供しています。

第1章 エグゼクティブサマリー

第2章 略語リスト

第3章 調査範囲

  • 市場概要
  • 主な製品

第4章 市場調査手法

  • 市場調査プロセス
  • 調査手法

第5章 イントロダクション

第6章 市場情勢

  • 市場概要
  • 収益ベースの市場規模と予測
  • 収益ベースの市場規模と予測
  • ファイブフォース分析

第7章 バリューチェーンの分析

第8章 用途別の市場分類

第9章 地理区分

  • 世界のコールドチェーン市場:地域別の予測
  • 北米
    • 市場規模と予測
  • 欧州
    • 市場規模と予測
  • アジア太平洋地域
    • 市場規模と予測
  • その他の地域
    • 市場規模と予測

第10章 購入基準

第11章 市場成長因子

第12章 成長因子とその影響

第13章 市場の課題

第14章 成長因子と課題の影響

第15章 市場動向

第16章 動向とその影響

第17章 ベンダー情勢

  • 競合シナリオ
  • 市場シェア分析
  • その他の有力ベンダー

第18章 主要ベンダーの分析

  • Americold Logistics
  • Lineage Logistics
  • Swire Cold Chain Logistics
  • Preferred Freezer Services

第19章 関連レポート

このページに掲載されている内容は最新版と異なる場合があります。詳細はお問い合わせください。

目次
Product Code: IRTNTR5173

About Thin-film Metrology Systems

Thin film metrology systems are used to measure the film thickness accurately. A series of film layers that act as a conductors, semiconductors, or bare wafers are deposited on an IC during IC fabrication. Thin film metrology systems are required during thin film deposition process to monitor and measure thin film parameters such as thickness, resistivity, and stress. There are various technologies used to measure the film thickness which include profilometry, ellipsometry, spectroscopic reflectrometry, and X-ray analysis.

TechNavio's analysts forecast the Global Thin-film Metrology Systems market will grow at a CAGR of 3.4 percent over the period 2014-2019.

Covered in this Report

This report covers the present scenario and growth prospects of the Global Thin Film Metrology Systems market for the period 2015-2019. It considers 2014 as the base year and provides data for the trailing 12 months. To calculate the market size, the report considers revenue generated from the sales of thin film metrology systems to various end-users including:

  • ODMs
  • OEMs
  • Foundries

Key Regions

  • Americas
  • APAC
  • EMEA

Key Vendors

  • KLA-Tencor
  • Nanometrics
  • Nova Measuring Instruments
  • Rudolph Technologies

Other Prominent Vendors

  • Hitachi High-Technologies
  • SCREEN Holdings
  • Semilab

Key Market Driver

  • Increased Level of Complexity in ICs
  • For a full, detailed list, view our report

Key Market Challenge

  • Cyclic Nature of Semiconductor Industry
  • For a full, detailed list, view our report

Key Market Trend

  • Increasing Demand for Integration and Miniaturization of Semiconductor Devices
  • For a full, detailed list, view our report

Key Questions Answered in this Report

  • What will the market size be in 2019 and what will the growth rate be?
  • What are the key market trends?
  • What is driving this market?
  • What are the challenges to market growth?
  • Who are the key vendors in this market space?
  • What are the market opportunities and threats faced by the key vendors?
  • What are the strengths and weaknesses of the key vendors?

Table of Contents

01. Executive Summary

02. List of Abbreviations

03. Scope of the Report

  • 03.1. Market Overview
  • 03.2. Product Offerings

04. Market Research Methodology

  • 04.1. Market Research Process
  • 04.2. Research Methodology

05. Introduction

06. Market Landscape

  • 06.1. Market Size and Forecast
  • 06.2. Five Forces Analysis

07. Geographical Segmentation

  • 07.1. Global Thin Film Metrology Systems Market by Geography

08. Buying Criteria

09. Market Growth Drivers

10. Drivers and their Impact

11. Market Challenges

12. Impact of Drivers and Challenges

13. Market Trends

14. Trends and their Impact

15. Vendor Landscape

  • 15.1. Competitive Scenario
  • 15.2. Market Share Analysis 2013
  • 15.3. Other Prominent Vendors
    • 15.3.1. SCREEN Holdings
    • 15.3.2. Semilab
    • 15.3.3. Hitachi High-Technologies

16. Key Vendor Analysis

  • 16.1. KLA-Tencor
    • 16.1.1. Key Facts
    • 16.1.2. Business Overview
    • 16.1.3. Product Segmentation
    • 16.1.4. Services Offered
    • 16.1.5. Geographical Segmentation by Revenue 2014
    • 16.1.6. SWOT Analysis
  • 16.2. Nanometrics
    • 16.2.1. Key Facts
    • 16.2.2. Business Overview
    • 16.2.3. Business Segmentation by Revenue 2013
    • 16.2.4. Business Segmentation by Revenue 2012 and 2013
    • 16.2.5. Geographical Segmentation by Revenue 2013
    • 16.2.6. Business Strategy
    • 16.2.7. Recent Developments
    • 16.2.8. SWOT Analysis
  • 16.3. Nova Measuring Instruments
    • 16.3.1. Key Facts
    • 16.3.2. Business Overview
    • 16.3.3. Product Segmentation
    • 16.3.4. Geographical Segmentation by Revenue 2013
    • 16.3.5. Business Strategy
    • 16.3.6. Key Developments
    • 16.3.7. SWOT Analysis
  • 16.4. Rudolph Technologies
    • 16.4.1. Key Facts
    • 16.4.2. Business Overview
    • 16.4.3. Business Segmentation by Revenue 2013
    • 16.4.4. Business Segmentation by Revenue 2012 and 2013
    • 16.4.5. Geographical Segmentation by Revenue 2013
    • 16.4.6. Business Strategy
    • 16.4.7. Recent Developments
    • 16.4.8. SWOT Analysis

17. Other Reports in this Series

List of Exhibits

  • Exhibit 1: Market Research Methodology
  • Exhibit 2: Semiconductor Value Chain
  • Exhibit 3: Global Thin Film Metrology Systems Market (US$ million)
  • Exhibit 4: Global Thin Film Metrology Systems Market by Geography 2014-2019 (CAGR)
  • Exhibit 5: Global Thin Film Metrology Systems Market by Geography 2014-2019
  • Exhibit 6: Global Thin Film Metrology Systems Market by Geography 2014-2019 (US$ million)
  • Exhibit 7: Global Thin Film Metrology Systems Market by Vendor Segmentation 2014
  • Exhibit 8: KLA-Tencor: Product Segmentation
  • Exhibit 9: KLA-Tencor: Services Offered
  • Exhibit 10: KLA-Tencor: Geographical Segmentation by Revenue 2014
  • Exhibit 11: Nanometrics: Business Segmentation by Revenue 2013
  • Exhibit 12: Nanometrics: Business Segmentation by Revenue 2012 and 2013 (US$ billion)
  • Exhibit 13: Nanometrics: Geographical Segmentation by Revenue 2013
  • Exhibit 14: Nova Measuring Instruments: Product Segmentation 2013
  • Exhibit 15: Nova Measuring Instruments: Geographical Segmentation by Revenue 2013
  • Exhibit 16: Rudolph Technologies: Business Segmentation by Revenue 2013
  • Exhibit 17: Rudolph Technologies: Business Segmentation by Revenue 2012 and 2013(US$ million)
  • Exhibit 18: Rudolph Technologies: Geographical Segmentation by Revenue 2013
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